BibTeX record journals/tcad/MayugaSI20

• > Home > journals/tcad/MayugaSI20

@article{DBLP:journals/tcad/MayugaSI20,
  author       = {Gian Mayuga and
                  Yasuo Sato and
                  Michiko Inoue},
  title        = {Highly Reliable Memory Architecture Using Adaptive Combination of
                  Proactive Aging-Aware In-Field Self-Repair and {ECC}},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {39},
  number       = {8},
  pages        = {1688--1698},
  year         = {2020},
  url          = {https://doi.org/10.1109/TCAD.2019.2925365},
  doi          = {10.1109/TCAD.2019.2925365},
  timestamp    = {Thu, 24 Sep 2020 11:27:32 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MayugaSI20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}